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The following modifications and additions to the original DCR1134 are included in this DCR; see replacement attachment ESCC 9000 Draft 10E for details (which highlights in yellow all changes from ESCC 9000 issue 9):
a) Editorial changes in the finalised specification for the purposes of clarification and consistency:
· Para. 2.1: addition of ESCC 2029000, 2269000
· Para. 4.1, 7.1.2.1, 7.1.2.2: add "unless otherwise specified, …"
· New Para. 4.2.1: several minor editorial changes are included
· Para. 8.25: option for the 4000h life test also added to the duration bullet.
· New Chart F0: redrawn with some editorial changes and clarifications to the contents
b) As agreed with and required by PSWG#83:
· Para. 8.12.2 & Chart F4A: Addition of temperature cycling test in Chart F4A for wire-bonded integrated circuits
· Chart F4A: change to the required quantity of life test samples (in the endurance subgroup) for Single Phase Qualification of wire-bonded integrated circuits to be 45 for qualification testing (retaining 15 etc samples for Periodic Testing).
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