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The change in this DCR proposed against the PIND test in ESCC 5000 and 5010 shall be replaced by the following:
The proposed wording for Para 8.7 of 5000 and Para. 8.9 of 5010 is as follows (i.e. changes to the internal package height limits and associated test frequencies):
…………………
8.x PARTICLE IMPACT NOISE DETECTION (PIND)
MIL-STD-750, Test Method 2052, Test Condition A.
The use of the same attachment medium for the Sensitivity Test Unit (STU) and for the components under test (DUT) is not mandatory.
PIND prescreening shall not be performed.
The test frequency shall be selected based on the average internal package height from the formula given in the test method. The average internal package height shall be the distance measured from the floor of the package cavity, excluding the thickness of the die mounted inside the package, to the underside of the package lid. Unless otherwise specified, for heights of less than 23mils the test frequency shall be 130Hz and for heights greater than 250mils the test frequency shall be 40Hz.
The lot shall be submitted to ….. etc (no further changes to the test paragraph)
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