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The following amendments and additions are included in this DCR based on the
PSWG approval of ESCC 3001 draft 2E (at PSWG #71 on 19/11/2015):
The original DCR attachment is replaced by ESCC 3001 issue 2 (which is a
tidied up version of draft 2E as approved by the PSWG)
Item 2) is amended as follows:
Operating Life test duration is clarified to be as follows (previously was
2000hours for Qual / 1000hours for LAT2):
: 2000 ±48 hours; applicable to Qualification Testing, and to Periodic
Testing for renewal of qualification after lapse.
: 1000 ±24 hours; applicable to Periodic Testing for extension of
qualification.
Item 14) is amended as follows:
Para 2.1, 2.2 & 4.5, Material outgassing (& restrictions) reference document
is corrected to be ESCC Basic Specification No. 22600 (which in turn refers
to ECSS-Q-ST-70-02).
Item 19) is amended as follows:
Para 5.2.2, Steady State Humidity Test is deleted from Special In-Process
Controls. It is added to Chart F4 but with the following amendments:
: The sampling is changed: Chart F4 Subgroup 1A samples size = 20
components per test vehicle selected for the Qualification Test Sublot (was
12 components from the highest capacitance value of each chip size for every
fired ceramic lot)
: The test is now performed on encapsulated components (whereas previously
it was performed on samples that were not coated or encapsulated).
: The initial rapid change of temperature processing is covered by the
previous test in Chart F4 Subgroup 1A.
: The test duration is 1000h (was 240h)
: It is clarified that only Insulation Resistance is measured at 1.5V
during the final measurements
: Change in Capacitance limits are also applied during the test (whereas
previously only an absolute limit was applied)
Item 20) is amended as follows:
Para 8.1.2, Distribution of the Qualification Test Lot (Para 7.1.2 & Chart
F4 Note 1 in ESCC 3001 draft 2E): The sample distribution and quantity of
components & test vehicles to be used in the Qualification Test Lot for
qualification and qualification maintenance is amended.
Item 29) is amended as follows:
Para 9.13 Climatic Test Sequence is deleted (also from Charts IV & V).
Item 30) is amended as follows:
Para 9.14 Damp Heat Steady State is deleted (also from Chart IV).
Item 34) is amended as follows:
Para 10.5 Chart F2 Data (Para 9.5 in ESCC 3001 draft 2E): Data for
Microsection is clarified as follows:
" For Microsection Inspection, an examination report that includes
photographs shall be prepared."
The following new items are added to this DCR:
35) Para 5.2.3 Robustness of Terminations: rework & retest is now permitted
if a single failure occurs. Lot failure only applies if 2 or more failures
occur during the first test (previously it was 1 failure).
36) Para 9.5.1.4.1(a) Voltage Proof: The voltage application time is changed
to be 5 +/-1 second (was 1 minute)
37) New Chart F4 (that replaces Charts IV & V):
: Robustness of Terminations test is not included in Chart F4.
: Resistance to Soldering Heat test is moved to the Assembly Capability
Subgroup
: Climatic Sequence tests are not included in Chart F4 (in 2
subgroups)(See item 29)
: Damp Heat Steady State test is not included in Chart F4 (see Item 30)
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