Page 1 & 5, Spec Title & Para 1.1: add "BFY193C" to the list of types.
Page 5, Para 1.7: change to read "Variants 04 to 08" (was "04 to 07").
Page 6 Table 1(a): Add new Variant 08 to table with row details:
08, BFY193C, MICRO-X1, 2, D2
Page 7, Table 1(b):
Nos. 1, 2, 3: change to read "Variants 03 to 08" (was "03 to 07")
Nos. 5, 6, 7: change to read "Variants 06, 08" (was "Variant 06")
Page 8, Figure 1: change to read "Variants 06, 08 (104C) " (was "Variant 06 (104C)")
Add to Notes: "Variant 08: 165C/W"
Page 11, Para 4.3.4(b): change to read "Variants 06 to 08" (was "06 and 07")
Page 11, Para 4.3.5(a): change to read "Variants 01 to 06 and 08" (was "01 to 06")
Page 14, 15, 16, Table 2:
Nos. 1, 2 & Note 1: change to read "Variants 03 to 08" (was "03 to 07")
Nos. 5, 6, 8, 9, 10, 11, 12, 13, 14: change to read "Variants 06, 08" (was "Variant 06")
No. 7: change to read "Variants 05, 06, 08" (was "Variants 05-06")
Page 16, Table 2: Add new characteristic No. 15, 1/f Noise, as follows:
.................
No.: 15
Characteristic: 1/f Noise
Symbol: F10Hz
Test Fig.: -
Test Conditions:
f = 10Hz, VCE = 3V
IC = 8mA, R = 2kOhm
Variant 08
(Notes 12 , 13)
Limits: - min, 300 max
Unit: nV/root Hz
................
Add new notes 12 & 13:
"12. Measured using a suitable noise analyser."
"13. LTPD15 per wafer, sample testing. In case of failure, 100% testing shall be applied."
Page 17, Table 3(a) No. 2: change to read "Variants 03 to 08" (was "03 to 07")
Page 17, Table 3(b) No. 6: change to read "Variants 06, 08" (was "Variant 06")
Page 20, Table 5(a) No. 2: change to read "Variants 03 to 08" (was "03 to 07")
Page 20, Table 5(b):
No. 1: change to read "Variants 04 to 08" (was "04 to 07")
No. 3: change to read "Variants 06, 08" (was "Variant 06")
No. 4: change to read "Variants 03 to 08" (was "03 to 07")
Page 24, Table 6 No. 6: change to read "Variants 06, 08" (was "Variant 06")
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