LoginComponent Details PPH25
Component |
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| EPPL Part: | 2 | |||
| Part Type: | PPH25 | |||
| Group: | MICROCIRCUITS | Subgroup: | MICROWAVE MONOLITIC INTEGRATED CIRCUITS (MMIC) | |
| Package: | ||||
| Description: | ||||
0.25 µm Power P-HEMT technology Proccess: 0.25µm pseudomorphic HEMT (AlGaAs/InGaAs/AlGaAs/GaAs) with double gate recess Technology suitable for power switch/attenuator and power amplifier up to 35GHz |
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ESCC Specifications: |
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| Other Specifications: | ||||
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| Manufacturer: | ||||
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UMS Bât Charmille - Parc Silic de Villebon - Courtaboeuf, 10 avenue du Québec 91140 Villebon-sur-Yvette France |
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| Ref. number: | ||||
| 20804629921232691081 | ||||
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Approval Status
Qualification: |
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| Others | |||
| Other: | |||
| ESCC evaluation in accordance to 2269010 completed in December 2014 | |||
| Highest screening level (MIL): | |||
| Evaluation programmes or other approvals: | |||
| Space evaluation final report (NE_10S_PPH25_Space_Evaluation_report_V2) | |||
| Former space usage: | |||
| Technology used by Thales Alenia Space for COSMO programme | |||
Previous Procurement and Test Data
Test data (Evaluation, Lot acceptance, DPA, MIL QCI/TCI, ...): |
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| Etude de la fiabilité sous contrainte RFde la filière PPH25 (CNES study) NE.32S.04511 Internal PPH25 re-qualification 2008 (NE_32S_04651) | |||
Radiation Hardness Data
Total Dose Effects: |
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| Displacement damage: | |||
| Single event effects (SEL/SEU/SET/SEFI/SEB/SEGR/others): | |||
| SEE Radiation was tested on PPH25X-10 and the process is fully comparable to PPH25, therefore the conclusion for SEE is applicable to PPH25. PPH25X-10 was tested in DC+RF up to 8dB of Gain Compression: No evidence of sensitivity to Heavy Ions (ESA STUDY : SEE TESTING OF EUROPEAN GaAs TECHNOLOGIES Contract No. 4000102424/11/NL/CP) | |||
Remarks |
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