LoginComponent Details CHA5350-99F
Component |
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| EPPL Part: | 2 | ||||
| Part Type: | CHA5350-99F | ||||
| Group: | MICROCIRCUITS | Subgroup: | MICROWAVE MONOLITIC INTEGRATED CIRCUITS (MMIC) | ||
| Package: | |||||
| Description: | |||||
K-band Power Amplifier |
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ESCC Specifications: |
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| Other Specifications: | |||||
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| Manufacturer: | |||||
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UMS Bât Charmille - Parc Silic de Villebon - Courtaboeuf, 10 avenue du Québec 91140 Villebon-sur-Yvette France |
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| Ref. number: | |||||
| 9728998021929088531 | |||||
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Approval Status
Qualification: |
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| Others | |||
| Other: | |||
| MMIC process PPH15X-10 is listed in EPPL part2 Space validation of this die has been completed satisfactorily under ESA ECI 2 program | |||
| Highest screening level (MIL): | |||
| - | |||
| Evaluation programmes or other approvals: | |||
| MMIC design fully validated in accordance with ECSS-Q-ST-60-12 | |||
| Former space usage: | |||
| - | |||
Previous Procurement and Test Data
Test data (Evaluation, Lot acceptance, DPA, MIL QCI/TCI, ...): |
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| Summary report available | |||
Radiation Hardness Data
Total Dose Effects: |
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| Radiation tests were performed on the process for TID and Displacement Damage | |||
| Displacement damage: | |||
| Radiation tests were performed on the process for TID and Displacement Damage | |||
| Single event effects (SEL/SEU/SET/SEFI/SEB/SEGR/others): | |||
| SEE test with RF on the MMIC has been performed at UCL. The MMIC (CHA5350) manufactured on PPH15X-10 technology has been submitted successfully to Xenon heavy ion beam up to a fluency of 107 ions/cm-2 (ESCC Basic Specification No. 25100). No catastrophic failure has been observed up to Vds = 7V and 5dB of compression. The circuit safe operating area of Vds = 6V and 4dB of compression has been successfully covered. | |||
Remarks |
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