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The above DCR text is amended as follows:
Note – Modifications as follows include those requested by REL-STPI/F, as agreed by ESA & CNES.
The proposed draft specification is changed to be 3602/002 draft 2B which incorporates all changes per this DCR including these modifications.
Item 10) Delete item and replace with the following:
13) Para 4.7.1 & Table 4, Miss Test is renamed ‘Run-in’ and Table 4 is used to specify Parameter Drift Values.
Miss Test Contact Resistance limit is deleted from Table 4 and replaced by Latch Voltage & Reset Voltage drift values. Drift value limits are not specified at this time. Drift values are to be recorded for information purposes only in order to amass data so that suitable drift value limits can be specified at a later date (in a later revision).
Item 22) Delete item and replace with the following:
24) Table 6, Addition of drift values (for Latch Voltage & Reset Voltage) during the following tests:
Note - Drift value limits are not specified in the table at this time. Drift values are to be recorded for information purposes only in order to amass data so that suitable drift value limits can be specified at a later date (in a later revision). Note 1 is added to clarify this position.
· Vibration (= Low Level Sine Vibration)
· Mechanical Shock (= Low Level Mechanical Shock)
· Overload
· Intermediate Current
· Operating Life Resistive (= Resistive Life)
• Operating Life Low Level Load and Mechanical Shock (= Low Level Life)
· Random Vibration (new test)
· High Level Sine Vibration (new test)
· High Level Mechanical Shock (new test)
Note 1 also permits an additional measurement (of drift parameters) prior to the test in question in order to facilitate the drift calculation.
Item 23) Table 6.
Replace the Operating Life Resistive bullet with the following:
· Operating Life Resistive (= Resistive Life): 2.8V during monitoring (clarification only; no actual change); 20mV during final measurements (was 40mV)
Replace the Intermediate Current bullet with the following:
• Intermediate Current: 300mV during monitoring (clarification only; no actual change); 20mV during final measurements
In the Justification section amend ‘d) Implement drift measurement’ to read as follows:
d) Implement drift measurement for Latch Voltage & Reset Voltage during Screening (over Run-in) and during Qualification and Periodic Testing on specific tests (see items 10 & 22 above). Limits have not been specified at this time due to lack of applicable performance data. Measurements will now be recorded for information purposes so that suitable drift value limits can be specified at a later date in a further revision of this specification. This change has been agreed with the ESCC QPL Manufacturer REL-STPI/F.
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