1N6642U DCR639
Approved wording if different from 'Proposed Wording' above or reason for rejection
The original attachment to this DCR, provided by STMicroelectronics, is replaced by the attached 5101/026 issue 2 Draft B.
This change wording serves to implement the new STM Variants 07 and 08 and at the same time perform a total reformat of this Detail Specification (under Generic Specification No. 5000) as part of the ongoing conversion of legacy ESA/SCC formatted specifications to the ESCC format. See below for summary of changes and attached Issue 2 Draft B of the Specification.
Note: known support for active procurement against this specification includes the following manufacturers:
STMICROELECTRONICS/F are currently willing to support the procurement of new Variants 07 and 08.
MICROSEMI/I have indicated some interest in supporting some types covered by this specification. Full details are not currently available but it is expected that types 1N66XX, MIL qualified per MIL-PRF-19500/578 in various packages, may be considered. However is has been confirmed by MICROSEMI/I that existing Variants 01 to 06 are not supported in their currently specified form. It is intended to proceed with a new update of this specification in order to implement additional Variants for MICROSEMI/I once this DCR has been approved and implemented.
Summary of changes to the current format, layout and content is as follows:
a) Rewording and restructure of various sections and paragraphs of the specification plus other editorial changes based on the layout and editorial content of other Detail Specifications already converted to ESCC format, as well as changes to make the Detail specification consistent with the current ESCC Generic Specification No. 5000.
b) Removal of any redundant paragraphs and information,
e.g.: Figure 1; mechanical paragraph; Figures 4, 5(a), 5(b); Appendix A for MICROSEMI/I
c) Removal of all requirements specifically applicable to obsolete types & Variants 01 to 06, plus addition and amendment of requirements as apply to the new 1N6642U Variants 07 & 08 and for STM. This impacts the following locations in the specification:
Title page: remove reference to 1N6638, 1N6643. Only type 1N6642U now applies to this spec issue 2.
Para 1.7: delete reference to tin-lead plated lead finish
Table 1(a): delete obsolete Variants 01 to 06 and add 07 & 08 for type 1N6642U in LCC2D package
Table 1(b): Soldering Temperature, Junction Temperature, Thermal Resistance
Figure 2
Figure 3
Para 4.2 & 4.2.1 to 4.2.5: all deviations from Generic Spec are deleted.
Para 4.3.2
Para 4.3.3
Para 4.4.1, 4.4.2
Table 2
Table 3(a) & 3(b)
Table 4
Table 5(a) & 5(b)
Table 6
Details of specific technical changes are as follows (See attached 5101/026 Issue 2 Draft B for full details):
1) Table 1(b) (now Para 1.5): Forward Surge Current rating is changed to be 2A maximum (was 2.5A) based on STM characterisation data.
2) Para 4.2.2(g) additional Surge Current Test is not required (this is justified based on use of STM’s internal Pilot Lot procedure N° 7188211 )
3) Table 2 Breakdown Voltage test V(BR) (now Para 2.3.1):
Test is replaced by equivalent Reverse Current test (IR3)
4) Table 2 Reverse Recovery Time 1 trr1 (now Para 2.3.1):
Test is considered guaranteed but not tested based on testing of added parameter Reverse Recovery Time 2 trr2.
5) Table 3(b) (now Para 2.3.2 & Appendix A):
Reverse Current (IR3 for Breakdown Voltage) is added (but is considered guaranteed but not tested based on STM’s pilot lot testing).
6) Table 4 Breakdown Voltage test V(BR) (now Para 2.4):
Test is deleted as the specified Breakdown Voltage test does not produce a result that can be used for delta calculations (i.e. The test per MIL-STD-750 Method 4021 is effectively a go-no-go test)
7) Table 5(a) (now Para 2.6):
Duration is changed to be >=48h (was 72h) for clarification purposes.
8) Table 5(b) (now Para 2.7):
Power Burn-in conditions are amended to reflect a test operating the components at junction temperature.
9) Table 6 (now Para 2.5):
Change/delta Limits for parameters are not included; only absolute limits apply.
Reverse Current (IR3 for Breakdown Voltage) is added.
10) General deviations to the ESCC Generic & Detail Specs, as already agreed in other ESCC published Detail Specs for STM, are included as Appendix A for STM.
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Justification:
as above
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