Document change request DCR483

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DCR:  483

Number:483

Name:nicolas martini

E-mail:nicolas.martini@vishay.com

Organisation:CNES

Changes required for:Qualification

Status:Implemented

Date status:2009-03-30

Signature:Tony Gouder

Document attachments: No attachments available

Modifications: the following minor editorial amendments to the text to be included in the Detail spec on points 1 & 3 of DCR483 for clarification purposes: ............ For 4001/023 1 - amend title to be based on type "PHR and PFR" (similar to 4001/025) 3 - Appendix A, add new item: Items Affected High and Low Temperatures Electrical Measurements Description of Deviations All tests at high and low temperatures are guaranteed but tested based on temperature coefficient measurements performed on each wafer at +25C and +75C in accordance with VISHAY specification CM-SF-00210. ............ For 4001/025 Only item 3 of DCR483 applies to 4001/025 (amended as follows): 3 - Appendix A, add new item: Items Affected High and Low Temperatures Electrical Measurements Description of Deviations All tests at high and low temperatures are guaranteed but tested based on temperature coefficient and relative temperature coefficient measurements performed on each wafer at +25C and +75C in accordance with VISHAY specification CM-SF-00210.

Documents affected: (4001/025) Resistor Arrays, Fixed, Surfac ... (4001/023) Resistors fixed film chips, ba ...

Other DCRs affecting these documents: No other DCRs

Changes

(4001/025) Resistor Arrays, Fixed, Surface Mount, Thin Film, ...

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(4001/023) Resistors fixed film chips, based on type P HR

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