|
|
|
|
|
|
|
|
|
|
|
|
the following minor editorial amendments to the text to be included in the Detail spec on points 1 & 3 of DCR483 for clarification purposes:
............
For 4001/023
1 - amend title to be based on type "PHR and PFR" (similar to 4001/025)
3 - Appendix A, add new item:
Items Affected
High and Low Temperatures Electrical Measurements
Description of Deviations
All tests at high and low temperatures are guaranteed but tested based on temperature coefficient measurements performed on each wafer at +25C and +75C in accordance with VISHAY specification CM-SF-00210.
............
For 4001/025
Only item 3 of DCR483 applies to 4001/025 (amended as follows):
3 - Appendix A, add new item:
Items Affected
High and Low Temperatures Electrical Measurements
Description of Deviations
All tests at high and low temperatures are guaranteed but tested based on temperature coefficient and relative temperature coefficient measurements performed on each wafer at +25C and +75C in accordance with VISHAY specification CM-SF-00210.
|
|
|
Login
