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Show only changes
DCR:
252
Number:
252
Name:
S JEFFERY
E-mail:
steve.jeffery@igg.co.uk
Organisation:
Changes required for:
General
Status:
Implemented
Date status:
2006-04-04
Signature:
Ralf de Marino
Document attachments:
5202001_Issue_2_-_Draft_A.pdf
Modifications:
Item 12: Change item 12 wording from “…(was hfe) and MIL-STD-750 Test Method corrected to 3306 (was 3206).” to “…(was hfe), MIL-STD-750 Test Method corrected to 3306 (was 3206) and IC Test Condition amended to be -20mA (was -50mA).”
Documents affected:
(5202/001) Transistors Low Power PNP, bas ...
Other DCRs affecting these documents:
DCR187
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