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o DCR item 1) Radiographic Change for Flip-Chip: is rejected; Ref PSWG#111 item 3.1.1
o DCR item 2) Post test Data Point for Burn-in & Op. Life to be +96hours: Accepted
o DCR item 3) Screening PDA Lot Failure criteria to exclude Hi & Lo Temp failures: is rejected; Ref PSWG#111 item 3.1.1
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