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The DCR changes are replaced by the following as agreed with ESA/CNES/Cobham:
Change the Rated Voltage UR in the end column of the Para. 1.4.2 Component Type Variants and Range of Components table (on spec page 7) to be 200V (was 400V) together with the addition of a new Note 2 against the rated voltage field for these 2 Variants as follows:
Note 2: Oxide Nominal Rated Voltage = 400V, and Oxide Breakdown Voltage = 600V, tested only during wafer fabrication.
The following minor editorial change is also added:
• Para. 2.2 wording is amended to “The information to be marked on the primary package shall be as follows:”.
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